Integrated optics for astronomical interferometry - II. First laboratory white-light interferograms
نویسندگان
چکیده
We report first white-light interferograms obtained with an integrated optics beam combiner on a glass plate. These results demonstrate the feasability of singlemode interferometric beam combination with integrated optics technology presented and discussed in Paper I (Malbet et al. 1999). The demonstration is achieved in laboratory with off-the-shelves components coming from micro-sensor applications, not optimized for astronomical use. These two-telescope beam combiners made by ion exchange technique on glass substrate provide laboratory white-light interferograms simultaneously with photometric calibration. A dedicated interferometric workbench using optical fibers is set up to characterize these devices. Despite the rather low match of the component parameters to astronomical constraints, we obtain stable contrasts higher than 93% with a 1.54-μm laser source and up to 78% with a white-light source in the astronomical H band. Global throughput of 27% for a potassium ion exchange beam combiner and of 43% for a silver one are reached. This work validates our approach for combining several stellar beams of a long baseline interferometer with integrated optics components.
منابع مشابه
Astronomy and Astrophysics Integrated Optics for Astronomical Interferometry Ii. First Laboratory White-light Interferograms
Your thesaurus codes are: 03(03.09.2) Abstract. We report first white-light interferograms obtained with an integrated optics beam combiner on a glass plate. These results demonstrate the feasability of single-mode interferometric beam combination with integrated optics technology presented and discussed in paper I (Malbet et al. 1999). The demonstration is achieved in laboratory with off-the-s...
متن کاملAn infrared integrated optic astronomical beam combiner for stellar interferometry at 3-4 microm.
Integrated-optic, astronomical, two-beam and three-beam, interferometric combiners have been designed and fabricated for operation in the L band (3 microm--4 microm) for the first time. The devices have been realized in titanium-indiffused, x-cut lithium niobate substrates, and on-chip electro-optic fringe scanning has been demonstrated. White light fringes were produced in the laboratory using...
متن کاملOptical profiling using white light interference in spectral domain
The rapidly developing fields of Micro-Electro Mechanical System (MEMS) and micro optics require non contact and high precision measurements. Optical profilers are ideally suited for this. Monochromatic Phase Shifting Interferometry(PSI) can be used to measure slowly varying profiles and step height of less than half a wavelength. White light interferometry is used when large step height are to...
متن کاملPhase-shifting interferometry corrupted by white and non-white additive noise.
The standard tool to estimate the phase of a sequence of phase-shifted interferograms is the Phase Shifting Algorithm (PSA). The performance of PSAs to a sequence of interferograms corrupted by non-white additive noise has not been reported before. In this paper we use the Frequency Transfer Function (FTF) of a PSA to generalize previous white additive noise analysis to non-white additive noisy...
متن کاملSpectral interferometry and reflectometry used for characterization of a multilayer mirror.
A white-light spectral interferometric technique is used to retrieve a relative spectral phase and group delay of a multilayer mirror from the spectral interferograms recorded in a dispersive Michelson interferometer. The phase retrieval is based on the use of a windowed Fourier transform in the wavelength domain, and characterization of the multilayer mirror is completed by a three-step measur...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 1999